T 44 The across-plane conductivity and microstructure of SrZr0.95 Y0.05 O3 − δ thin films / L. A. Dunyushkina, S. V. Plaksin , V. M. Kuimov, V. P. Gorelov, S. V. Smirnov // Ionics. - 2013. - Vol. 19, № 12. - P1715-1722. - Bibliogr. : p. 1722 (19 ref.) Рубрики: ХИМИЧЕСКИЕ НАУКИ Кл.слова (ненормированные): ЭЛЕКТРОПРОВОДНОСТЬ -- СПЕКТРОСКОПИЯ -- ПРОВОДИМОСТЬ ПРОТОННАЯ Аннотация: The across-plane electrical conductivity of the proton-conducting SrZr0.95Y0.05O3 − δ thin films fabricated by chemical solution deposition on single-crystalline ZrO2 doped by 10 mol% of Y2O3 (YSZ) substrates was investigated using impedance spectroscopy. The average grain size of the films was found to increase considerably with thermal treatment. This change in grain size has a strong effect on the electrical behavior of films. Our results show that the electrochemical performance of the cell is strongly affected by the potential difference at the film/substrate interface. Coarse-grain film microstructure was proved to be preferable for the reduction of both the film resistance and interfacial barrier. |