Вид документа : Статья из журнала Шифр издания : 54/T 44 Автор(ы) : Dunyushkina L. A., Plaksin S. V., Kuimov V. M., Gorelov V. P., Smirnov S. V. Заглавие : The across-plane conductivity and microstructure of SrZr0.95 Y0.05 O3 − δ thin films Место публикации : Ionics. - 2013. - Vol. 19, № 12. - С. 1715-1722 Примечания : Bibliogr. : p. 1722 (19 ref.) ББК : 54 Предметные рубрики: ХИМИЧЕСКИЕ НАУКИ Ключевые слова (''Своб.индексиров.''): электропроводность--спектроскопия--проводимость протонная Аннотация: The across-plane electrical conductivity of the proton-conducting SrZr0.95Y0.05O3 − δ thin films fabricated by chemical solution deposition on single-crystalline ZrO2 doped by 10 mol% of Y2O3 (YSZ) substrates was investigated using impedance spectroscopy. The average grain size of the films was found to increase considerably with thermal treatment. This change in grain size has a strong effect on the electrical behavior of films. Our results show that the electrochemical performance of the cell is strongly affected by the potential difference at the film/substrate interface. Coarse-grain film microstructure was proved to be preferable for the reduction of both the film resistance and interfacial barrier. Доп.точки доступа: Dunyushkina, L. A.; Дунюшкина Лилия Адибовна; Plaksin , S. V.; Kuimov, V. M.; Gorelov, V. P.; Горелов Валерий Павлович; Smirnov, S. V.