The Possibility of the Use of Extended Fine Structure of Secondary Electron Spectra for Analysis of the Nearest Atomic Surrounding Parameters

The Possibility of the Use of Extended Fine Structure of Secondary Electron Spectra for Analysis of the Nearest Atomic Surrounding Parameters / D. E. Guy, D. V. Sumin, Yu. V. Ruts, V. I. Grebennikov // 3rd Russian-German Seminar on Electron and X-ray Spectroscopy, September 15-19, 1999, Yekaterinburg, Russia : Program and Abstracts. - Yekaterinburg, 1999. - P. 36.

Документ доступен в ЦНБ УрО РАН: 

Нет

Год: 

1999

Связанные персоналии: 

Нет

Рубрики: 

  • Физика, Химические науки

Вид издания: 

  • тезисы


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