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26.09.2016-16:25 |
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IEEE Transactions on Electron Devices 2016 V. 63 N 9 |
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26.09.2016-16:24 |
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Заводская лаборатория. Диагностика материалов 2016 Т.82 N 8 |
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26.09.2016-16:24 |
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IEEE Transactions on Electron Devices 2016 V. 63 N 8 |
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26.09.2016-16:22 |
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